LABORATORY
PHOTOELECTRICAL AND OPTICAL PHENOMENA IN WIDE BAND GAP SEMICONDUCTORS
HEAD: Assoc.Prof. Diana Nesheva, Ph.D.
tel: 7144-226; e-mail: nesheva@issp.bas.bg
TOTAL STAFF: 11
RESEARCH SCIENTISTS: 8
Assoc.Prof. E.Skordeva, Ph.D.
Assoc.Prof. Z.Ivanova, Ph.D.
Assoc.Prof. D.Arsova, Ph.D.
Assoc.Prof. V.Pamukchieva, Ph.D.
Assoc.Prof. Z.Aneva, Ph.D.
Asist.Prof. L.Yurukova
Asist.Prof. Z.Levi
A.Rachkova, chemist
I.Bineva, chemist
E.Zaharincheva, technologist
G.Tschauschew, physicist
RESEARCH ACTIVITIES:
1. DISORDERED MATERIALS - CHALCOGENIDE GLASSES AND THIN FILMS
Compositional dependences and photoinduced changes of the optical
properties of GexSb20-xÒe80 thin films are investigated.
It is found that the optical band gap of the films increases with x. Compositional
dependences of the mechanical strain in GexSb40-xS60
films deposited on c-Si substrates are studied and two extrema are observed related to the
existence of the "strain free phase" and topological phase transition. Illumination and
annealing of the films result in decrease and increase of the mechanical strain,
respectively. The influence of the light and thermal treatments on the local electronic
structure of GexSb40-xS60 glasses and thin films is
explored by 121Sb Mossbauer spectroscopy. A relation is observed between the
Mossbauer parameters and the level of structural disorder of the materials studied. The
kinetics of crystallization and phase transition of bulk
GexSb40-xSe60 glasses are investigated by
differential-thermal and x-ray diffraction analyses. It is shown that at x≤27 these
glasses are very stable since they do not undergo any crystallization.
EXAFS and XANES investigations of the local structure of glasses and thin films from the
As2S3-Ge2S3 and
As2S3-GeS2 systems are performed. The light and thermally
induced changes of the structure are also studied, the results being still under
processing.
Low-constrained glasses from the AsxS1-x system are synthesized
having average coordination number between 2.16 and 2.4. Their density is determined and
some physico-chemical parameters are calculated. Raman scattering spectra are measured on
three different compositions in the temperature range 293-23 Ê and a well-pronounced Boson
peak is observed in the low-frequency region. Thin AsxS1-x films are
also deposited and compositional dependences of some their optical properties are explored.
Basic physicochemical, structural and luminescence properties of Er-doped
Ga2S3-GeS2 glasses are investigated. They show high
thermal and mechanical stability (Òg=360-4000C,
Tc-Òg~150 0C, HV=207-250 kg/mm2,
d=2.9-3.4 g/cm3). It is shown that Er3+ ions play role as charge
compensator of the non-bridging sulfurs due to local transformation of the main tetrahedral
structural units. The strong emission band at 1.54 μm under excitation with
λ=1.06 μm is assigned to transitions between sub-levels of the
4I13/2- and 4I15/2.levels. It is found that
the photoluminescence intensity increases by about 30 times with the addition of 25 mol %
Ga2S3 into GeS2, therefore the presence of Ga causes the
rather enhanced Er solubility.
2. LOW-DIMENSIONAL SYSTEMS
Carrier transport mechanism is studied in 1 μm thick Si-SiO2 thin films
containing Si nanocrystals (NCs) with average size of 3.2-3.7 nm. The films are deposited
on "conductive" (≤5 Ω.cm) and "resistive" (≤50 Ω.cm) silicon
substrates. The samples on the resistive substrates show linear (Ohmic) current-voltage
(I-V) characteristics at applied fields as high as 2.106 V/cm while the samples
on the conductive substrates exhibit one Ohmic (at lowest fields) and two super linear
parts. It is concluded that in the Ohmic regions current is due to thermally generated
carriers in the SiO2 matrix. At fields >3.104 V/cm space charge
limited currents are suggested. Spectral photocurrent measurements performed show that
carriers photogenerated in both silicon substrates and Si nanocrystals have contribution
to the total current measured. It is observed that photocarriers in Si NCs are excited by
light whose energy is higher than the optical band gap of bulk silicon, which proves the
quantum size increase of the optical band gap of nanocrystals.
Transient photocurrent and thermally stimulated currents are measured in polycrystalline
CdSe single layers as well as in SiOx-CdSe superlattices and composite films.
The density of defect state distribution is calculated in the upper half of the band gap
of the CdSe NCs. Two kinds of defect states are observed: that disposed at ~ 0.55 åV below
the conduction band is assigned to bilk defect; the other one situated ~ 0.7 åV is related
to defects at CdSe-CdSe interface.
3. AC ELECTROLUMINESCENCE. ELECTROLUMINESCENT STRUCTURES AND DISPLAYS
Basic colorimetric characteristics are studied of electroluminescence structures having
protective layers from TiO2 and As2S5. The relief of the
layers is varied and their surface roughness is studied. A relation between the maximum
height and mean-statistic deviation of the roughness and structure characteristics is
established.
New electroluminescence structures comprising a silicon-polymer layer are designed that
have both protective and packing functions. As-prepared structures show pretty good
brightness and time stability. A thermal treatment procedure is developed which increases
the brightness of these structures between 6 and 10 times. This result opens the door for
fabrication of bright displays with a high stability.
Films from various conjugated polymers are produced and the possibility for application of
those films is explored in development of new kinds of electroluminescence structures.
Layers from ZnS powder in an epoxy oligomer are prepared. Various concentrations of
fullerens and highly dispersive carbon are added to the films and their effect of the
film properties is investigated. In order to clarify the process of electoluminescence
activation in the films, measurements of diffusion scattering, dielectric losses,
electrical resistance and ZnS electroluminescence are carried out. Investigations of
electrical, optical and luminescence properties of gamma-modified ion-implanted carbon
and selenium in various polymers are also in progress.
PUBLICATIONS:
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D. Arsova, V. Pamukchieva, E. Vateva, E. Skordeva, "Photo- and thermo-induced bandgap
and volume changes in Ge-based chalcogenide films", J. Mat. Sci.: Materials in
Electronics, 14, 835-836 (2003).
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D. Platikanova, E. Skordeva, D. Arsova, "Short- and medium-range order in thin
As2S1.5Se1.5-Gex films: irreversible photostructural
changes", J. Mat. Sci.: Materials in Electronics, 14, 833-834 (2003).
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E. Vateva, D. Arsova, E. Skordeva, V. Pamukchieva, "Irreversible and reversible
changes in band gap and volume of chalcogenide films", J. Non-Cryst. Sol., 326&327,
243-247 (2003).
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V.Pamukchieva, A.Szekeres, K.Todorova, "Optical study of
GexSb20-xTe80 chalcogenide films", J. Mat. Sci.:
Materials in Electronics, 14, 837-838 (2003).
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K.Christova, A.Manov, V.Pamukchieva, A.G.Fitzerald, L.Jiang, "Mechanical stress study
of amorphous GexSb40-xS60 films", J. Non-Cryst. Sol.,
325, 142-149 (2003).
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Z.G. Ivanova, E. Cernoskova, V.S. Vassilev, S.V. Boycheva, "Thermomechanical and
structural characterization of GeSe2-Sb2Se3-ZnSe
glasses", Mater. Lett., 57, 1025-1028 (2003).
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Z.G. Ivanova, V.S. Vassilev, E. Cernoskova, Z. Cernosek, "Physicochemical, structural
and luminescence properties of Er-doped Ge-S-Ga glasses", J. Phys. Chem. Solids, 64,
107-110 (2003).
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Z.G. Ivanova, Z. Aneva, Z. Cernosek, E. Cernoskova, V.S. Vassilev, "Influence of Ga on
the luminescence efficiency of Er-doped Ge-S-Ga glasses", J. Mat. Sci.: Materials in
Electronics, 14, 761-762 (2003).
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V. Balitska, R. Golovchak, A. Kovalskiy, E. Skordeva and O. I. Shpotyuk, "Effect of
Co60 γ-irradiation on the optical properties of As-Ge-S glasses", J.
Non-Cryst. Sol., 326-327, 130-134 (2003).
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S.Balabanov, K.Velitchkova, K. Krezhov, M. Sendova-Vassileva, "Photo-luminescence of
carbon implanted polyethylene and its modification by gamma irradiation", Vacuum, 69,
107-112 (2003).
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K. Krezhov, K. Velitchkova, S. Balabanov, "Transport properties of selenium implanted
polymer composites", Vacuum, 69, 113-118 (2003).
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T. Tsvetkova, S. Balabanov, E. Skordeva, S. Kitova, J. Sielanko, D. Maszka, J. Zuk,
"Ion implantation induced surface morphology changes in As3Se2 films", Vacuum, 69,
471-475 (2003).
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Bineva, D. Nesheva, Z. Aneva, Z. Levi, C. Raptis, H. Hofmeister, S. Stavrev, "Effects
of annealing atmosphere and substrate on the photoluminescence and Raman scattering
from Si nanocrystals in SiO2 matrix", J. Material Sci.:Materials for
Electronics, 14, 799 (2003).
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S. Reynolds, C. Main, I. Zrinscak, Z. Aneva and D. Nesheva, "A study of electronic
defects in hydrogenated amorphous silicon prepared by the expanding thermal plasma
technique", Mat. Res. Soc. Symp. Proc. 762, A19.14.1 (2003).
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V.S. Vassilev, Z.G. Ivanova, "Reversible α↔β phase transition in the
narrow-gap semiconducting Ag4SSe compound", Bulletin of the Chemists and
Technologists of Macedonia, Skopje (Macedonia), 22, No 1, pp. 21-24 (2003).
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V.S. Vassilev, L.N. Alzhihmany, P. Petkov, Z.G. Ivanova, "Glass-formation region,
properties and structure of Ag2Se3-GeSe2-Ag4SSe
chalcogenide system", Intern. Scientific Conference, 20-21 November, Gabrovo, Vol. 2,
349-352 (2003), in Bulgarian.
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Ê. Kolentsov, L. Yurukova, Ò. Êåhlibarov, À. Zheliazkova, "Îrganic color displays and
possibilities for their application in textile industry", Tekstil i obleklo, 8, 11-12
(2003), in Bulgarian.
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Bineva, D. Nesheva, M. Sendova-Vassileva, Z. Aneva and Z. Levi, "Annealing behaviour
of photoluminescence from a-SiOx thin films", Nanoscience and
Nanotechnology, Eds. E. Balabanova and I. Dragieva, Heron press, 3, 91 (2003).
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R. Kotsilkova, E. Krusteva, D. Nesheva, T. Djunova, S. Stavrev, "Carbon nanoparticles
in polymer: rheological properties and conductivity", Nanoscience and Nanotechnology,
Eds. E. Balabanova and I. Dragieva, Heron press, 3, 169 (2003).
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E. Skordeva, "Photoinduced changes in amorphous
GexAs(Sb)40-xS60 films", in the Homage Book dedicated
to the Academician, Professor Andrei Andriesh and Prof. Serghei Shutov with their 70's
anniversaries "Contributions to Non-Crystalline Semiconductor Physics and to
Optoelectronics", eds. Arthur Buzdugan&Mihai Iovu, Int. Association of Academies of
Sciences, Chisinau, pp. 40-49 ( 2003) .
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L. Pramatarova, E. Pecheva, D. Nesheva, Z. Levi, Z. Aneva, R. Pramatarova,
U. Bismayer, T. Petrov, "Study of modified solid surfaces by nanostructured CdSe in
SiOx thin films", Physica Status Solidi C, 0, No3, 1070-1074 (2003).
ONGOING RESEARCH PROJECTS:
Financed by the Bulgarian Academy of Sciences:
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Investigation of amorphous low-coordinated As-S materials
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Semiconductor nanoparticles in SiOx thin film matrix: formation, structure
and properties
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Fabrication of electroluminescence structures based on new materials and media and
investigation of their electroluminescence characteristics.
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Luminescence of chalcogenide glasses doped with rare earth elements.
Financed by the Bulgarian Ministry of Education and Sciences:
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Photoinduced structural changes in Ge-As(Sb)-S glasses and films
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Defect states in photoconductors of various dimensionality.
TEACHING ACTIVITIES:
Technical University, Sofia: "Semiconductor electroluminescence displays", 20 hours
lectures and 4 diploma works prepared by students from the Technical University.
COLLABORATION:
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Electronic properties of nanocrystalline II-VI semiconductors, University Abertay
Dundee, Scotland.
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Nano and micro scale structural transformations in thin films from glassy
semiconductors: physical problems and possible applications, Physico-Technical
Institute of the Russian Academy of Sciences, St. Petersburg, Russia.
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Thermodynamic and optical investigations on chalcogenide glasses, Joint Laboratory of
Solid State Chemistry, Pardubice, Czech Republic.
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Defects and transport parameters of nanocrystalline CdSe and amorphous Si, University
Abertay Dundee, Scotland.
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Àmorphous semiconductors:structure, properties and possible applications, Indian
Institute of Technology, Kanpur, India.
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