·  Methods characterizing the crystal structure as well as two- and three- dimensional defects of the grown crystals:
   o X- Ray diffraction methods:
           the Laue method,
           the diffraction traverse topography,
           single crystal and powder diffractometry.
   o Transmission electron microscopy.
   o Scanning electron microscopy.
   o X- ray micro- probe analysis, EDAX etc. 

·  Optical transmission spectroscopy in the visible and infrared part of the spectrum.

·  Raman spectroscopy.

·  Measurements of the resistivity as well as of some transport parameters of large band gap semiconductors and oxide materials.   

Methods characterizing the crystal structure